Overview Features Benefits Use Cases Accelerate the detection of defective wafers using the VIA Factory AI Wafer Visual Inspection Solution. Running an optimized AI model that identifies defects by analyzing wafer images taken by an industrial camera, this cutting-edge solution is suitable for use on all sizes of wafer. By eliminating human errors resulting from […]
Manufacturers around the globe are under huge pressure to maintain a competitive advantage and early interest in Internet of Things (IoT) and AI technology is maturing into ongoing digital transformation programmes.
VIA Edge Computing systems simplify the optimization of industrial automation processes by enabling the efficient real-time collection and analysis of mission-critical data from factory and building equipment.