Accelerate the detection of defective wafers using the VIA Factory AI Wafer Visual Inspection Solution.
Running an optimized AI model that identifies defects by analyzing wafer images taken by an industrial camera, this cutting-edge solution is suitable for use on all sizes of wafer. By eliminating human errors resulting from inattentiveness, tiredness, and poor judgment, it delivers pinpoint levels of accuracy in identifying even the slightest defects, achieving a recall rate of nearly 100% and a false positive rate of less than 5%.
By automating the inspection process, the VIA Factory AI Wafer Visual Inspection Solution enables silicon wafer manufacturers and assembly houses to accomplish significant gains in plant efficiency and operator safety. With its powerful Edge AI processing capabilities and seamless connectivity to an ERP network or corporate cloud, the solution also provides a wealth of data analysis and insights that enterprises can harness to further boost operational efficiency and safety.
Features
The VIA Factory AI Wafer Visual Inspection Solution is fast and easy to deploy and is scalable across multiple production lines. The solution is comprised of the following key components and can be customized to meet specific usage requirements:
- High-performance AI inferencing and training server powered by NVIDIA RTX GPUs
- Optimized wafer defect detection AI model for analyzing images
- USB industrial camera
Benefits
Increases defect detection accuracy to nearly to 100%
Achieves a false positive rate of less than 5%
Minimizes staffing costs and potential for human error
Quick and easy to deploy with seamless network connectivity
Boosts worker safety by reducing exposure to intense lighting and chemicals
Use Cases
The VIA Factory AI Wafer Visual Inspection Solution has enabled one of the world’s leading semiconductor companies to speed up the defect detection process, reduce staffing costs, and create a safer and cleaner environment.
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